Coherent diffraction surface imaging in reflection geometry
نویسندگان
چکیده
منابع مشابه
Coherent diffraction surface imaging in reflection geometry.
We present a reflection based coherent diffraction imaging method which can be used to reconstruct a non periodic surface image from a diffraction amplitude measured in reflection geometry. Using a He-Ne laser, we demonstrated that a surface image can be reconstructed solely from the reflected intensity from a surface without relying on any prior knowledge of the sample object or the object sup...
متن کاملCoherent Diffraction Imaging
For centuries, lens-based microscopy, such as light, phase-contrast, fluorescence, confocal and electron microscopy, has played an important role in the evolution of modern science and technology. In 1999, a novel form of microscopy, known as coherent diffraction imaging (CDI) or lensless imaging, was developed and transformed our traditional view of microscopy, in which the diffraction pattern...
متن کاملQuantitative phase measurement in coherent diffraction imaging.
We demonstrate high spatial resolution phase retrieval of a non-periodic gold nano-structure using the method of Fresnel coherent diffractive imaging. The result is quantitative to better than 10% and does not rely on any a priori knowledge of the sample.
متن کاملCoherent total internal reflection dark-field microscopy: label-free imaging beyond the diffraction limit.
Coherent imaging is barely applicable in life-science microscopy due to multiple interference artifacts. Here, we show how these interferences can be used to improve image resolution and contrast. We present a dark-field microscopy technique with evanescent illumination via total internal reflection that delivers high-contrast images of coherently scattering samples. By incoherent averaging of ...
متن کاملMicro-beam Laue alignment of multi-reflection Bragg coherent diffraction imaging measurements.
Multi-reflection Bragg coherent diffraction imaging has the potential to allow three-dimensional (3D) resolved measurements of the full lattice strain tensor in specific micro-crystals. Until now such measurements were hampered by the need for laborious, time-intensive alignment procedures. Here a different approach is demonstrated, using micro-beam Laue X-ray diffraction to first determine the...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Optics Express
سال: 2010
ISSN: 1094-4087
DOI: 10.1364/oe.18.007253